The effect of stress anisotropy on the lattice strains measured with an X-ray diffraction opposed anvil setup

Singh, AK (1994) The effect of stress anisotropy on the lattice strains measured with an X-ray diffraction opposed anvil setup. In: Proceedings of the National Conference on High Pressure Science and Technology, 10-11 Oct 1994, Bangalore, India.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: X-ray diffraction;Anisotropy
Subjects: PHYSICS > Physics(General)
Depositing User: M/S ICAST NAL
Date Deposited: 16 Sep 2008
Last Modified: 24 May 2010 04:26
URI: http://nal-ir.nal.res.in/id/eprint/4856

Actions (login required)

View Item View Item
nalir is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.