Measurement of stress: Photographic method

Balasingh, C and Singh, AK (1969) Measurement of stress: Photographic method. Technical Report. National Aeronautical Laboratory, Bangalore, India.

[img] PDF
Restricted to Repository staff only

Download (833kB)
[img] Indexer Terms (Generate index codes conversion from application/pdf to indexcodes)
Restricted to Repository staff only

Download (8kB)


The X-ray diffraction technique provides a non-destructive means of measuring residual stresses in polycrystalline samples. After a brief review of the principle, scope and limitations of this method, the details of the experimental procedure followed in this laboratory have been described in this report.

Item Type: Monograph (Technical Report)
Uncontrolled Keywords: X-ray;Photographic method;Poly crystalline;Diffraction;Back- reflection;Calibration curve
Subjects: AERONAUTICS > Aerodynamics
Depositing User: M/S ICAST NAL
Date Deposited: 19 Dec 2006
Last Modified: 24 May 2010 04:24

Actions (login required)

View Item View Item