Pushparaj, Leo K and Ebadulla, Khalid M and Khan, Abdul Malik and Sunder, R and Venkatesh, CS (1989) DC potential drop technique for crack length measurement. Technical Report. National Aeronautical Laboratory, Bangalore, India.
![[img]](https://nal-ir.nal.res.in/style/images/fileicons/application_pdf.png) |
PDF
tr_pdst_8935_R86293_txt.pdf Restricted to Repository staff only Download (19MB) |
![[img]](https://nal-ir.nal.res.in/style/images/fileicons/other.png) |
Indexer Terms (Generate index codes conversion from application/pdf to indexcodes)
indexcodes.txt Restricted to Repository staff only Download (16kB) |
Abstract
This. document describes an automated method for crack length measurement. One of the promising methods studied practically was the DC Potential Drop technique for crack length measurement. The possibility of using a pu1sed DC13; method was investigated, whereby a strong current would be pulsed across the specimen and the potential drop measured. This involved the development of instrumentation for generation of constant current pulses and precision measurement of voltages in the microvolts range. The effort also includes suitable interfacing with a Z80 Microprocessor to enable programmable DCPD measurements.
| Item Type: | Monograph (Technical Report) |
|---|---|
| Uncontrolled Keywords: | Crack length measurement;Software package |
| Subjects: | ENGINEERING > Electronics and Electrical Engineering |
| Depositing User: | Ms Indrani V |
| Date Deposited: | 11 Aug 2006 |
| Last Modified: | 24 May 2010 04:14 |
| URI: | http://nal-ir.nal.res.in/id/eprint/1915 |
Actions (login required)
 |
View Item |
