X-ray diffraction line broadening under elastic deformation13; of a polycrystalline sample: An elastic-anisotropy effect

Singh, AK and Balasingh, C (2001) X-ray diffraction line broadening under elastic deformation13; of a polycrystalline sample: An elastic-anisotropy effect. Journal of Applied Physics, 90 (5). pp. 2296-2302. ISSN 0021-8979

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    Abstract

    A homogeneous stress field imposed on a polycrystalline sample containing elastically anisotropic13; crystallites produces an inhomogeneous strain field. The average strain causes a shift of the13; diffraction-line position, and the variance of the strain is a measure of line broadening. Though the13; shift of the line is commonly observed, earlier attempts to measure the broadening caused by elastic13; anisotropy were not conclusive. In the article, expressions have been derived for the average strain13; and variance of strain for a polycrystalline sample cubic system! subjected to uniaxial elastic stress.13; The 310! and 222! lines of beta brass under an uniaxial load have been recorded using Co K aand13; Cu K aradiations, respectively. The average strain and variance of strain derived from the measured13; diffraction line profiles are in good agreement with those predicted by the theory. The present13; measurements provide conclusive evidence for the diffraction line broadening caused purely by13; elastic anisotropy. xA9; 2001 American Institute of Physics.

    Item Type: Journal Article
    Uncontrolled Keywords: X-ray diffraction;Elastic-anisotropy;Lattice strain
    Subjects: CHEMISTRY AND MATERIALS > Metals and Metallic Materials
    Division/Department: Materials Science Division, Materials Science Division
    Depositing User: Ms Indrani V
    Date Deposited: 05 Aug 2008
    Last Modified: 24 May 2010 09:39
    URI: http://nal-ir.nal.res.in/id/eprint/773

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