Sample-curvature error in stress measurement made with an x-ray diffractometer

Singh, AK and Balasingh, C (1973) Sample-curvature error in stress measurement made with an x-ray diffractometer. Journal of Applied Crystallography, 6 . pp. 466-471.

Full text available as:
[img] PDF
Download (334Kb)

    Abstract

    The effect of an arbitrary sample curvature on the centroid-shift and the broadening (variance) of a diffraction-line profile is discussed for the seemann-Bohlin geometry of a diffractometer. The errors in stress measurement arising from the curvature 0f the sample surface are estimated .The shift of the centroid and hence ,the error in stress increase with increasing equatorial divergence and curvature of the sample for example, for a cylinder of radius 10mm.Ao/K increases from 0.075 at1 divergence to 0.32 at 2 divergence for w=D-60 and bragg angle 70. The analysis helps one to choose the experimental parameters to keep the errors small in case this is not possible, the expressions derived in this paper can be used to minimum variance is different from that given by the seemann-bohlin para focusing condition.However, the line-widths for the two positions do not differ appreciably.

    Item Type: Journal Article
    Additional Information: Copyright for this article belongs to Blackwell-synergy
    Uncontrolled Keywords: X-ray diffraction;Stress measurement;Seemann-Bohlin
    Subjects: AERONAUTICS > Aeronautics (General)
    Division/Department: Materials Science Division, Materials Science Division
    Depositing User: M/S ICAST NAL
    Date Deposited: 22 May 2008
    Last Modified: 17 Jun 2010 11:20
    URI: http://nal-ir.nal.res.in/id/eprint/4720

    Actions (login required)

    View Item