Balasingh, C and Singh, AK (2000) Residual stresses and their measurements by x-ray diffraction methods. Metals Materials and Processes, 12 (2 amp;). 269 -280.
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Abstract
The residual stress plays a key role in determining: the life and dimensional stability of n precision13; machine component. This article review the various factors leading lo the formation of residual stresses and13; describes the x-ray diffraction technique for the measurement residual stresses. Emphasis is given to the recent developments which. Permit the estimation of(a) triaaial stresses, (b) stresses in the various phases of a multiphase material such as ceramic composites, and (c)The stresses in Composites containing non-crystalline or poorly Crystalline materials such be polymer matrix composites. Some example are given from the work carried out at the National Aerospace Laboratories.
| Item Type: | Journal Article |
|---|---|
| Additional Information: | Copyright for this article belongs to Meshap Science Publishers |
| Uncontrolled Keywords: | Residual stresses;Measurement;X-ray diffraction |
| Subjects: | CHEMISTRY AND MATERIALS > Chemistry and Materials (General) |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | M/S ICAST NAL |
| Date Deposited: | 26 Aug 2008 |
| Last Modified: | 17 Jun 2010 10:42 |
| URI: | http://nal-ir.nal.res.in/id/eprint/4669 |
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