X-RAY ANALYSIS OF STACKING FAULTS IN YTTERBIUM

Vijayan, Kalyani (1988) X-RAY ANALYSIS OF STACKING FAULTS IN YTTERBIUM. Journal of Materials Science Letters, 7 (9). pp. 993-994.

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Abstract

At room temperature ytterbium has a predominantly fcc structure. However, a small amount of the hcp structure corresponding to the low- as well as the high-temperature phases is also known to coexist with the room-temperature fcc structure. We have earlier reported that mechanical deformation of 99. 2 percent pure ytterbium specimens at room temperature, induces a partial structural transformation of the type fcc yields hcp. Based on the stacking fault probabilities, the matching of the unit cells of the fcc and the deformation induced hcp phases and the recrystallization, it is concluded that the deformation-induced transformation in ytterbium is essentially a stacking fault effect. 19 Refs.

Item Type: Journal Article
Uncontrolled Keywords: CRYSTALS - Defects; METALLOGRAPHY - Recrystallization; METALS AND ALLOYS - X-Ray Analysis; MECHANICAL DEFORMATION; STACKING FAULTS; STRUCTURAL TRANSFORMATION; YTTERBIUM;
Subjects: CHEMISTRY AND MATERIALS > Chemistry and Materials (General)
Division/Department: Materials Science Division
Depositing User: Mr Vijaianand SK
Date Deposited: 31 Mar 2005
Last Modified: 24 May 2010 09:38
URI: http://nal-ir.nal.res.in/id/eprint/407

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