Balasingh, C and Singh, AK (1969) Measurement of stress: Photographic method. Technical Report. National Aeronautical Laboratory, Bangalore, India.
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Abstract
The X-ray diffraction technique provides a non-destructive means of measuring residual stresses in polycrystalline samples. After a brief review of the principle, scope and limitations of this method, the details of the experimental procedure followed in this laboratory have been described in this report.
| Item Type: | Proj.Doc/Technical Report (Technical Report) |
|---|---|
| Uncontrolled Keywords: | X-ray;Photographic method;Poly crystalline;Diffraction;Back- reflection;Calibration curve |
| Subjects: | AERONAUTICS > Aerodynamics |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | M/S ICAST NAL |
| Date Deposited: | 19 Dec 2006 |
| Last Modified: | 24 May 2010 09:54 |
| URI: | http://nal-ir.nal.res.in/id/eprint/3779 |
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