Measurement of stress: Photographic method

Balasingh, C and Singh, AK (1969) Measurement of stress: Photographic method. Technical Report. National Aeronautical Laboratory, Bangalore, India.

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    Abstract

    The X-ray diffraction technique provides a non-destructive means of measuring residual stresses in polycrystalline samples. After a brief review of the principle, scope and limitations of this method, the details of the experimental procedure followed in this laboratory have been described in this report.

    Item Type: Proj.Doc/Technical Report (Technical Report)
    Uncontrolled Keywords: X-ray;Photographic method;Poly crystalline;Diffraction;Back- reflection;Calibration curve
    Subjects: AERONAUTICS > Aerodynamics
    Division/Department: Materials Science Division, Materials Science Division
    Depositing User: M/S ICAST NAL
    Date Deposited: 19 Dec 2006
    Last Modified: 24 May 2010 09:54
    URI: http://nal-ir.nal.res.in/id/eprint/3779

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