Effect of x-ray diffractometer geometrical factors on the centroid shift of a diffraction line for stress measurement

Singh, AK and Balasingh, C (1971) Effect of x-ray diffractometer geometrical factors on the centroid shift of a diffraction line for stress measurement. Journal of Applied Physics, 42 (13). pp. 5254-5260.

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    Abstract

    Expressions for the centroid shift of a diffraction line due to geometrical factors have been deduced for a diffractometer case in which the specimen surface is inclined to the X-ray beam at an arbitrary angle. Such a geometry is encountered in the determination of residual stress using a diffractometer. The effects of the centroid shift of a diffraction line due to geometrical factors on the stress derived from the diffractometer measurements have been discussed.

    Item Type: Journal Article
    Additional Information: Copyright belongs to American Institute of Physics
    Uncontrolled Keywords: Centroids;Diffractometers;X ray diffraction;X ray stress management;Focusing;Instrument errors;Residual stress
    Subjects: PHYSICS > Physics(General)
    Division/Department: Materials Science Division, Materials Science Division
    Depositing User: Mr. Ravikumar R
    Date Deposited: 12 Dec 2006
    Last Modified: 24 May 2010 09:54
    URI: http://nal-ir.nal.res.in/id/eprint/3658

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