Singh, AK and Balasingh, C (1971) Effect of x-ray diffractometer geometrical factors on the centroid shift of a diffraction line for stress measurement. Journal of Applied Physics, 42 (13). pp. 5254-5260.
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Abstract
Expressions for the centroid shift of a diffraction line due to geometrical factors have been deduced for a diffractometer case in which the specimen surface is inclined to the X-ray beam at an arbitrary angle. Such a geometry is encountered in the determination of residual stress using a diffractometer. The effects of the centroid shift of a diffraction line due to geometrical factors on the stress derived from the diffractometer measurements have been discussed.
| Item Type: | Journal Article |
|---|---|
| Additional Information: | Copyright belongs to American Institute of Physics |
| Uncontrolled Keywords: | Centroids;Diffractometers;X ray diffraction;X ray stress management;Focusing;Instrument errors;Residual stress |
| Subjects: | PHYSICS > Physics(General) |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | Mr. Ravikumar R |
| Date Deposited: | 12 Dec 2006 |
| Last Modified: | 24 May 2010 09:54 |
| URI: | http://nal-ir.nal.res.in/id/eprint/3658 |
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