Murthy, VV S and Vijayan, Kalyani (1984) Computer programs 'FOURIER' and 'ALPLOT' for x-ray line profile analysis. Technical Report. National Aeronautical Laboratory, Bangalore,India.
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Abstract
In connection with x-ray line profile analysis of polycrystalline materials, the FORTRAN programs 'FOURIER' and 'ALPLOT' have been developed for use with the SPERRY UNIVAC 1100/60 computer system. These programs compute (a) the Fourier coefficients (b) the full width at half maximum (FWHM) (c) the integrated intensity (d) locate13; the peak maximum and (e) provide an x-y plot of any profile.
| Item Type: | Proj.Doc/Technical Report (Technical Report) |
|---|---|
| Uncontrolled Keywords: | Fourier,Alplot,X-ray line profile analysis |
| Subjects: | CHEMISTRY AND MATERIALS > Chemistry and Materials (General) |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | M/S ICAST NAL |
| Date Deposited: | 02 Nov 2006 |
| Last Modified: | 24 May 2010 09:52 |
| URI: | http://nal-ir.nal.res.in/id/eprint/3269 |
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