Computer programs 'FOURIER' and 'ALPLOT' for x-ray line profile analysis

Murthy, VVS and Vijayan, Kalyani (1984) Computer programs 'FOURIER' and 'ALPLOT' for x-ray line profile analysis. Technical Report. National Aeronautical Laboratory, Bangalore,India.

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Abstract

In connection with x-ray line profile analysis of polycrystalline materials, the FORTRAN programs 'FOURIER' and 'ALPLOT' have been developed for use with the SPERRY UNIVAC 1100/60 computer system. These programs compute (a) the Fourier coefficients (b) the full width at half maximum (FWHM) (c) the integrated intensity (d) locate13; the peak maximum and (e) provide an x-y plot of any profile.

Item Type: Monograph (Technical Report)
Uncontrolled Keywords: Fourier,Alplot,X-ray line profile analysis
Subjects: CHEMISTRY AND MATERIALS > Chemistry and Materials (General)
Depositing User: Users 90 not found.
Date Deposited: 02 Nov 2006
Last Modified: 19 Aug 2015 05:12
URI: http://nal-ir.nal.res.in/id/eprint/3269

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