Computer programs 'FOURIER' and 'ALPLOT' for x-ray line profile analysis

Murthy, VV S and Vijayan, Kalyani (1984) Computer programs 'FOURIER' and 'ALPLOT' for x-ray line profile analysis. Technical Report. National Aeronautical Laboratory, Bangalore,India.

Full text available as:
[img] PDF
Restricted to Archive staff only

Download (2824Kb)

    Abstract

    In connection with x-ray line profile analysis of polycrystalline materials, the FORTRAN programs 'FOURIER' and 'ALPLOT' have been developed for use with the SPERRY UNIVAC 1100/60 computer system. These programs compute (a) the Fourier coefficients (b) the full width at half maximum (FWHM) (c) the integrated intensity (d) locate13; the peak maximum and (e) provide an x-y plot of any profile.

    Item Type: Proj.Doc/Technical Report (Technical Report)
    Uncontrolled Keywords: Fourier,Alplot,X-ray line profile analysis
    Subjects: CHEMISTRY AND MATERIALS > Chemistry and Materials (General)
    Division/Department: Materials Science Division, Materials Science Division
    Depositing User: M/S ICAST NAL
    Date Deposited: 02 Nov 2006
    Last Modified: 24 May 2010 09:52
    URI: http://nal-ir.nal.res.in/id/eprint/3269

    Actions (login required)

    View Item