Vijayan, Kalyani (1988) X-ray analysis of stacking faults in ytterbium. Journal of Materials Science letters, 7 . pp. 993-994.
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Abstract
At room temperature ( z 300 K), ytterbium has a predominantly f c c structure [l, 21. However, a small13; amount of the h c p structure corresponding to the low- as well as the high-temperature phases [3-61 is also known to coexist [7, 81 with the room-temperature f c c structure. We have earlier reported [8] that mechanical deformation of 99.2% pure ytterbium specimens at room temperature, induces a partial structural transformation of the type f c c -+ h c p, leading to an enhancement of the h c p component in the deformed material. I t has also been found [9] that surfaces of ytterbium specimens subjected to polishing with emery or to filing also exhibit similar enhancement of the h c p component. These observations suggest that in 99.2% pure ytterbium, the f c c -+ h c p transformation which readily accompanies different types of13; mechanical treatments, is probably associated with the stacking faults in the material.
| Item Type: | Journal Article |
|---|---|
| Uncontrolled Keywords: | Room temperature;Ytterbium;X-ray analysis of stacking faults |
| Subjects: | CHEMISTRY AND MATERIALS > Metals and Metallic Materials CHEMISTRY AND MATERIALS > Chemistry and Materials (General) |
| Division/Department: | Materials Science Division |
| Depositing User: | M/S ICAST NAL |
| Date Deposited: | 11 Nov 2006 |
| Last Modified: | 24 May 2010 09:51 |
| URI: | http://nal-ir.nal.res.in/id/eprint/3072 |
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