An oscillatory variation of the half-width of x-ray diffraction-line profiles with fatigue cycling

Vijayan, Kalyani and Mani, A and Balasingh, C and Singh, AK (1986) An oscillatory variation of the half-width of x-ray diffraction-line profiles with fatigue cycling. Scripta Metallurgica, 20 . pp. 1767-1770.

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    Abstract

    It is well known that the fatigue cycling of crystalline materials can lead to detectable changes in the. x-ray diffraction-line profiles. As the full width at half maximum (FWHM) can be more easily derived from the line13; profile than other parameters such as variance or the Fourier co-efficients.many investigators(1-10) have studied the effect of fatigue cycling on the FWHM of the diffraction line. The studies pertaining to the effect of fatigue cycling on Fourier coeffients are limited(8,11,12). The results on steel(1-8),iron(3), aluminium(9,10), and silicon, gold and aluminium alloy(9) indicate13; that the ( b/b ) versus N curve (where N is number of fatigue cycles, and bo and b are the FWHMs,respectively, for the specimen before and after N cycles)in general shows three distinct stages. Fig.1 shows this curve for annealed specimen of aluminium when the measurements are made using CuK, radiation, so that diffraction occurs, from the near-surface reqion.6.Ohuchi

    Item Type: Journal Article
    Uncontrolled Keywords: Oscillatory variation;X-ray;Fatigue cycling
    Subjects: CHEMISTRY AND MATERIALS > Composite Materials
    CHEMISTRY AND MATERIALS > Chemistry and Materials (General)
    Division/Department: Materials Science Division, Materials Science Division, Materials Science Division, Materials Science Division
    Depositing User: M/S ICAST NAL
    Date Deposited: 10 Nov 2006
    Last Modified: 24 May 2010 09:51
    URI: http://nal-ir.nal.res.in/id/eprint/3056

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