Ramaseshan, S and Ramesh, TG (1971) Application of x-ray and electron spectroscopy to materials science. Technical Report. National Aeronautical Laboratory, Bangalore, India.
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Abstract
The basic principles underlying X-ray emission, Auger effect and X-ray absorption are reviewed in this note. The experimental methods of obtaining the energy of binding by the spectroscopy of ejected electrons (ESCA) are presented. The alteration in the energy levels due to covalent and ionic bonding is next discussed. The chemical shifts observed and its uses in the study of bonding, co-ordination, electro-negativity. oxidation states and in13; organic structure analysis are dealt with briefly with examples. The paper finally deals with the important application of X-ray spectroscopy in the study of band structure of materials and how the energy gaps can be measured. The theory of extended X-ray fine structure is briefly touched upon.
| Item Type: | Proj.Doc/Technical Report (Technical Report) |
|---|---|
| Uncontrolled Keywords: | X-ray emission;Chemical bonding;Spectrascopy |
| Subjects: | PHYSICS > Physics(General) CHEMISTRY AND MATERIALS > Chemistry and Materials (General) |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | Deputy Head Poornima Narayana |
| Date Deposited: | 24 Aug 2006 |
| Last Modified: | 24 May 2010 09:48 |
| URI: | http://nal-ir.nal.res.in/id/eprint/2490 |
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