Sankar, N and Krishanan, A (1988) Data analysis package for X-ray diffractometer. Technical Report. National Aeronautical Laboratory, Bangalore, India.
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Abstract
Details of a software package in BASIC for processing data from an automatic X-Ray diffractometer are presented. This package accepts rough scan data and calculates the data needed for the fine scan . Accepting fine scan data, the program calculates the peak,half-width and integral width. Plots of both the scan addition of a suitable data are also available . With the communication module this can be used in any real-time automatic X-Ray diffractometer analysis .
| Item Type: | Proj.Doc/Technical Report (Technical Report) |
|---|---|
| Uncontrolled Keywords: | Data analysis;Basics;X-ray |
| Subjects: | ENGINEERING > Structural Mechanics MATHEMATICAL AND COMPUTER SCIENCES > Computer Programming and Software |
| Division/Department: | Systems Engineering Division, Systems Engineering Division |
| Depositing User: | Deputy Head Poornima Narayana |
| Date Deposited: | 10 Aug 2006 |
| Last Modified: | 24 May 2010 09:46 |
| URI: | http://nal-ir.nal.res.in/id/eprint/2150 |
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