Data analysis package for X-ray diffractometer

Sankar, N and Krishanan, A (1988) Data analysis package for X-ray diffractometer. Technical Report. National Aeronautical Laboratory, Bangalore, India.

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    Abstract

    Details of a software package in BASIC for processing data from an automatic X-Ray diffractometer are presented. This package accepts rough scan data and calculates the data needed for the fine scan . Accepting fine scan data, the program calculates the peak,half-width and integral width. Plots of both the scan addition of a suitable data are also available . With the communication module this can be used in any real-time automatic X-Ray diffractometer analysis .

    Item Type: Proj.Doc/Technical Report (Technical Report)
    Uncontrolled Keywords: Data analysis;Basics;X-ray
    Subjects: ENGINEERING > Structural Mechanics
    MATHEMATICAL AND COMPUTER SCIENCES > Computer Programming and Software
    Division/Department: Systems Engineering Division, Systems Engineering Division
    Depositing User: Poornima Narayana
    Date Deposited: 10 Aug 2006
    Last Modified: 24 May 2010 09:46
    URI: http://nal-ir.nal.res.in/id/eprint/2150

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