DC potential drop technique for crack length measurement

Pushparaj, Leo K and Ebadulla, Khalid M and Khan, Abdul Malik and Sunder, R and Venkatesh, CS (1989) DC potential drop technique for crack length measurement. Technical Report. National Aeronautical Laboratory, Bangalore, India.

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    This. document describes an automated method for crack length measurement. One of the promising methods studied practically was the DC Potential Drop technique for crack length measurement. The possibility of using a pu1sed DC13; method was investigated, whereby a strong current would be pulsed across the specimen and the potential drop measured. This involved the development of instrumentation for generation of constant current pulses and precision measurement of voltages in the microvolts range. The effort also includes suitable interfacing with a Z80 Microprocessor to enable programmable DCPD measurements.

    Item Type: Proj.Doc/Technical Report (Technical Report)
    Uncontrolled Keywords: Crack length measurement;Software package
    Subjects: ENGINEERING > Electronics and Electrical Engineering
    Division/Department: Other, Other, Other, Structures Division, Structures Division
    Depositing User: Ms Indrani V
    Date Deposited: 11 Aug 2006
    Last Modified: 24 May 2010 09:44
    URI: http://nal-ir.nal.res.in/id/eprint/1915

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