Usha Devi, S and Singh, AK (1993) Estimation of the Phases of Silicon Carbide and Silicon nitride by the X-ray Diffraction Method. Technical Report. National Aerospace Laboratories, Bangalore, India.
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Abstract
The x-ray diffraction technique has been utilized to determine the phase content in silicon carbide and silicon nitride, using the calculated values of the diffraction intensities.
| Item Type: | Proj.Doc/Technical Report (Technical Report) |
|---|---|
| Uncontrolled Keywords: | Silicon carbide;Silicon nitride;X-ray diffraction |
| Subjects: | CHEMISTRY AND MATERIALS > Inorganic, Organic and Physical Chemistry AERONAUTICS > Aerodynamics |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | Mrs Neetu Chandra |
| Date Deposited: | 16 Jun 2006 |
| Last Modified: | 24 May 2010 09:43 |
| URI: | http://nal-ir.nal.res.in/id/eprint/1684 |
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