Estimation of the Phases of Silicon Carbide and Silicon nitride by the X-ray Diffraction Method

Usha Devi, S and Singh, AK (1993) Estimation of the Phases of Silicon Carbide and Silicon nitride by the X-ray Diffraction Method. Technical Report. National Aerospace Laboratories, Bangalore, India.

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    Abstract

    The x-ray diffraction technique has been utilized to determine the phase content in silicon carbide and silicon nitride, using the calculated values of the diffraction intensities.

    Item Type: Proj.Doc/Technical Report (Technical Report)
    Uncontrolled Keywords: Silicon carbide;Silicon nitride;X-ray diffraction
    Subjects: CHEMISTRY AND MATERIALS > Inorganic, Organic and Physical Chemistry
    AERONAUTICS > Aerodynamics
    Division/Department: Materials Science Division, Materials Science Division
    Depositing User: Mrs Neetu Chandra
    Date Deposited: 16 Jun 2006
    Last Modified: 24 May 2010 09:43
    URI: http://nal-ir.nal.res.in/id/eprint/1684

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