Estimation of the Phases of Silicon Carbide and Silicon nitride by the X-ray Diffraction Method

Ushadevi, S and Singh, AK (1993) Estimation of the Phases of Silicon Carbide and Silicon nitride by the X-ray Diffraction Method. Technical Report. National Aerospace Laboratories, Bangalore, India.

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Abstract

The x-ray diffraction technique has been utilized to determine the phase content in silicon carbide and silicon nitride, using the calculated values of the diffraction intensities.

Item Type: Monograph (Technical Report)
Uncontrolled Keywords: Silicon carbide;Silicon nitride;X-ray diffraction
Subjects: CHEMISTRY AND MATERIALS > Inorganic, Organic and Physical Chemistry
AERONAUTICS > Aerodynamics
Depositing User: Users 49 not found.
Date Deposited: 16 Jun 2006
Last Modified: 13 Oct 2015 07:28
URI: http://nal-ir.nal.res.in/id/eprint/1684

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