Devi, S Usha and Balasingh, C (1992) XRD Profile Fitting by the Simplex Method. Technical Report. National Aerospace Laboratories, Bangalore, India.
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Abstract
In x-ray diffraction experiments the parameters of interest are the position of the peak, fullwidth at half maximum intensity, integral width, peak intensity and integrated intensity. The profile fitting technique is used to derive accurate values of these parameters. In13; this report the results obtained by fitting four analytical functions (Gaussian, Lorentzian, Pearson VII and split Pearson VII) by the simplex method to the observed x-ray diffraction data from overlapping peaks13; are presented.
| Item Type: | Proj.Doc/Technical Report (Technical Report) |
|---|---|
| Uncontrolled Keywords: | X-ray diffration;Peak position;Profile fitting;Computer program |
| Subjects: | PHYSICS > Physics(General) |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | Mr. Ravikumar R |
| Date Deposited: | 15 Jun 2006 |
| Last Modified: | 24 May 2010 09:43 |
| URI: | http://nal-ir.nal.res.in/id/eprint/1678 |
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