Compressions of Si, MgO, and ZrSiO4 to 8 GPa as measured with a WC-anvil X-ray apparatus and epoxy pressure medium

Singh, AK and Kennedy, GC (1977) Compressions of Si, MgO, and ZrSiO4 to 8 GPa as measured with a WC-anvil X-ray apparatus and epoxy pressure medium. Journal of Applied Physics, 48 (8). pp. 3362-3367.

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    Abstract

    The compressions of silicon, magnesium oxide, and zircon have been measured to 8 GPa with a tungstencarbide opposed-anvil x-ray apparatus using a boron-epoxy gasket and epoxy as a pressure-transmitting medium- For silicon and magnesium oxide. the bulk modulus and its pressure derivative were obtained by fitting a second-degree polynominal to the x-ray data. For zircon, the husk modulus was determined by fitting an equation of the form (AV/Vo) = -(PI BxB0;). The values of the bulk modulus and its pressure derivative are B, = 99.4xB1;S GPa, B'r = 12:1, I for silicon: Bx201E; , 166xB1; 10 GPa. B'x201E; = 2-5:1: 1 for magnesium oxide; B, = 222 120 GPa for zircon. Its alt the cases, the present values of Be are in good agreement with those obtained from ultrasonic measurements. On the basis of these results it is suggested that the use of epoxy as a pressure-transmitting medium can greatly reduce the uniaxial stress component and improve the sample-pressure distribution in the study of materials possessing large shear strength.

    Item Type: Journal Article
    Uncontrolled Keywords: Pressure calibration;Tungsten-carbide-anvil x-ray;Piezoresistivity measurements
    Subjects: CHEMISTRY AND MATERIALS > Inorganic, Organic and Physical Chemistry
    Division/Department: Materials Science Division, Other
    Depositing User: Ms. Alphones Mary
    Date Deposited: 22 Jun 2006
    Last Modified: 24 May 2010 09:41
    URI: http://nal-ir.nal.res.in/id/eprint/1305

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