Optical and RF transparent protective alumina thin films

Esther, ACM and Sridhara, N and Sebastian, SV and Bera, Parthasarathi and Anandan, C and Aruna, ST and Rangappa, D and Sharma, AK and Dey, Arjun (2015) Optical and RF transparent protective alumina thin films. Journal of Materials Science: Materials in Electronics, 26 (12). pp. 9707-9716. ISSN 1573-482X

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      Abstract

      Protective alumina thin films of different thicknesses (35-95 nm) were grown by pulsed RF magnetron sputtering technique at room temperature on germanium (Ge) coated black polyimide (GBP) or Kapton® substrate which is often employed as sunshield membrane on communications satellite antennas. The thin alumina top layer provides shielding of Ge coating from degradation during storage. The alumina thin film was characterized by X-ray diffraction, field emission scanning electron microscopy and X-ray photoelectron spectroscopy techniques to investigate microstructural and electronic characteristics. Thermo-optical properties such as IR emittance, solar absorptance, reflectance and transmittance and electrical property e.g. sheet resistance of the deposited alumina films were measured. The RF losses e.g. insertion loss and return loss were measured in both Ku band (10.5 GHz to 14.5 GHz) and Ka band (27 GHz to 40 GHz). Finally, to prove anti-degradation behavior of alumina thin film, water droplet spreading experiments were carried out and evaluated it’s chemical degradation by XPS.

      Item Type: Journal Article
      Additional Information: Copyright for this article belongs to M/s. Springer-Verlag
      Uncontrolled Keywords: Alumina;Thin film;Germanium coated black Kapton; Transmittance;RF losses
      Subjects: CHEMISTRY AND MATERIALS > Chemistry and Materials (General)
      Division/Department: Other, Other, Other, Surface Engineering Division, Surface Engineering Division, Surface Engineering Division, Other, Other, Other
      Depositing User: Ms. Alphones Mary
      Date Deposited: 02 May 2016 09:40
      Last Modified: 02 May 2016 09:40
      URI: http://nal-ir.nal.res.in/id/eprint/12464

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