Study on cryorolled Al–Cu alloy using X-ray diffraction line profile analysis and evaluation of strengthening mechanisms

Krishna, NN and Tejas, R and Sivaprasad, K and Venkateswarlu, K (2013) Study on cryorolled Al–Cu alloy using X-ray diffraction line profile analysis and evaluation of strengthening mechanisms. Materials and Design, 52. pp. 785-790. ISSN 0261-3069

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Official URL: http://dx.doi.org/10.1016/j.matdes.2013.05.095

Abstract

Al–Cu alloy sheets were rolled at room temperature and at liquid nitrogen temperature to true strain values of 0.69 and 1.38. The microstructural changes and variation in mechanical properties due to the effect of rolling temperature was evaluated. X-ray diffraction line profile analysis was performed to calculate crystallite size, microstrain and dislocation density. Irrespective of the amount of reduction, cryorolled samples exhibited reduced crystallite size along with enhanced lattice strain and dislocation density than room temperature rolled samples. At both the reductions, cryorolled samples exhibited better hardness and strength compared to the room temperature rolled samples and the enhanced properties are attributed to the higher dislocation density of the cryorolled samples. The electron backscatter diffraction results indicated that the grains are submicron in size in rolled conditions. It also revealed that majority of the fraction of special grain boundaries are R1 boundaries with decreasing tendency of R3 boundaries. Quantitative contributions of different strengthening mechanisms were performed on the rolled samples and it was observed that significant contribution comes from grain boundary strengthening.

Item Type: Article
Additional Information: Copyright to this article belongs to M/s. Elsevier
Uncontrolled Keywords: Severe plastic deformation (SPD);Nanostructured materials;Al–Cu alloy sheets;Liquid nitrogen temperature
Subjects: CHEMISTRY AND MATERIALS > Chemistry and Materials (General)
Depositing User: Users 11 not found.
Date Deposited: 04 Jul 2014 04:45
Last Modified: 04 Jul 2014 04:45
URI: http://nal-ir.nal.res.in/id/eprint/11991

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