Balasingh, C and Singh, AK (2000) Residual Stresses and Their Measurements by X-Ray Diffraction Methods. Material Science Division, 12 (2 & 3). pp. 269-280.
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Abstract
The residual stress plays a key role in determining the life and dimensional stability of a precision machine component. This article reviews the various factors leading to the formation of residual stresses and describes the x-ray diffraction technique for the measurement of residual stresses . Emphasis is given to the recent developments which permit the estimation of (a) triaxial stresses, (b) stresses in the various phases of a multiphase material such as ceramic composites, and (c) the stresses in composites containing non-crystalline or poorly crystalline materials such as polymer matrix composites . Some examples are given from the work carried out at the National Aerospace Laboratories
| Item Type: | Journal Article |
|---|---|
| Uncontrolled Keywords: | residual stress, measurement, X-ray diffraction |
| Subjects: | CHEMISTRY AND MATERIALS > Chemistry and Materials (General) |
| Division/Department: | Materials Science Division, Materials Science Division |
| Depositing User: | Ms Indrani V |
| Date Deposited: | 30 Jan 2012 10:42 |
| Last Modified: | 30 Jan 2012 10:42 |
| URI: | http://nal-ir.nal.res.in/id/eprint/10282 |
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